Browse Prior Art Database

Electromigration Failure Detection

IP.com Disclosure Number: IPCOM000044903D
Original Publication Date: 1983-Jan-01
Included in the Prior Art Database: 2005-Feb-06
Document File: 2 page(s) / 42K

Publishing Venue

IBM

Related People

Anolick, ES: AUTHOR [+2]

Abstract

This circuit collects electromigration data without scanning, switching transients or ground loop problems. Failures are detected in a chain of samples. Neither side of the sample can or need be grounded. The circuit is more rapid than a scanning technique. With software, it can be used to record not only fails but also healing of post fail and the time and location of same. This circuit has application in electromigration, fuse link studies, and possible corrosion studies where opens are to be monitored.

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Electromigration Failure Detection

This circuit collects electromigration data without scanning, switching transients or ground loop problems. Failures are detected in a chain of samples. Neither side of the sample can or need be grounded. The circuit is more rapid than a scanning technique. With software, it can be used to record not only fails but also healing of post fail and the time and location of same. This circuit has application in electromigration, fuse link studies, and possible corrosion studies where opens are to be monitored.

In operation, the failure of a device places a higher voltage across the zener diode, opto isolator series devices. The zener diode then turns on and fires the LED (light-emitting diode) in the opto isolator. This turns on the light-sensitive transistor which outputs a 1 after the Schmitt trigger inverter. The N bit word can be read into a computerized data collection system.

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