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Adaptable Multi Pin Tester for Circuit Cards

IP.com Disclosure Number: IPCOM000045762D
Original Publication Date: 1983-Apr-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 3 page(s) / 60K

Publishing Venue

IBM

Related People

Praggastis, AK: AUTHOR [+2]

Abstract

Shown in Fig. 1 is a multi-pin test fixture for circuit cards. The fixture has an interchangeable multi-pin probe assembly 10. The probe assembly 10 is designed in accordance with the card 14 to be tested. Once the probe assembly 10 is in place, the circuit card to be tested is positioned in the fixture in front of the probe assembly. Closing gate 20 on the fixture will actuate the circuit card connections and bring the fixture probe assembly forward to contact electrically the test points on card 14. The wiring of the probe assembly 10 is determined by a computer program that produces a pin table list indicating how probe pins on assembly 10 must be wired to connectors on the back of assembly 10 for mating with connectors 12.

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Adaptable Multi Pin Tester for Circuit Cards

Shown in Fig. 1 is a multi-pin test fixture for circuit cards. The fixture has an interchangeable multi-pin probe assembly 10. The probe assembly 10 is designed in accordance with the card 14 to be tested. Once the probe assembly 10 is in place, the circuit card to be tested is positioned in the fixture in front of the probe assembly. Closing gate 20 on the fixture will actuate the circuit card connections and bring the fixture probe assembly forward to contact electrically the test points on card 14. The wiring of the probe assembly 10 is determined by a computer program that produces a pin table list indicating how probe pins on assembly 10 must be wired to connectors on the back of assembly 10 for mating with connectors 12.

To adapt the fixture to different cards, an operator selects the proper probe assembly 10 and inserts it into the fixture. The back of the probe assembly contains a connector to connect with connectors 12 in Fig. 1. With probe assembly 10 fastened in place in the fixture, circuit card 14 to be tested is positioned in the fixture frame in front of the probe assembly 10. Upper connector frame 16 may be freed by twisting knob 18 and lowered along rails 17 until it abuts the upper edge of card 14. Then, the upper connector assembly is tightened down with knob 18. Next, the operator swings the support gate 20 closed over the card 14.

Cross members 22 of the support gate 20 contain insulated supports 24 for the back of card 14 when the gate is closed. Men the tester is in operation, the fixture probe assembly 10 can push against the front of the card with sufficient force to break the card if the card is not supported in the back by supports 24.

When gate 20 closes, it makes contact with switch 26 and starts an automated sequence to make the electrical contacts to the card. First, the upper pin connectors 28 and the lower pin connectors 30 are moved pneumatically to make electrical connection to the upper and lower edge connectors on card 14. Then, the probe assembly...