Browse Prior Art Database

Multiple Detectors Shorts and Opens Tester

IP.com Disclosure Number: IPCOM000045797D
Original Publication Date: 1983-Apr-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 31K

Publishing Venue

IBM

Related People

Bard, SL: AUTHOR

Abstract

This arrangement provides an auxiliary detector 3, in addition to the present electron detector 5, in an electron beam tester. The auxiliary detector has the ability to determine the type of material being hit by the beam (such as an X-ray detector).

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Multiple Detectors Shorts and Opens Tester

This arrangement provides an auxiliary detector 3, in addition to the present electron detector 5, in an electron beam tester. The auxiliary detector has the ability to determine the type of material being hit by the beam (such as an X-ray detector).

The correct point for the electron beam to hit, in the course of doing a short and open test, is on a metal-covered area on a substrate or on a printed circuit under test. However, if the circuit is improperly positioned, or if the beam is deflected for some reason, the beam may fail to hit the correct place.

If the beam fails to hit the correct place on the part 7 for whatever reason, the auxiliary detector would determine this and would alert the system that the results may not be valid.

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