Browse Prior Art Database

Automated Crack Test Machine

IP.com Disclosure Number: IPCOM000045798D
Original Publication Date: 1983-Apr-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 53K

Publishing Venue

IBM

Related People

Darekar, VS: AUTHOR

Abstract

An automated technique for subjecting circuit card samples to temperature shock provides more reliable and consistent test results than hand operations.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 2

Automated Crack Test Machine

An automated technique for subjecting circuit card samples to temperature shock provides more reliable and consistent test results than hand operations.

Referring to the figure, a circuit card 1 is attached to a clamp 2 on an arm 3 in a loading station 4 and a transport mechanism is started. A motor and gear assembly 5 rotates screw shaft 6 with pinion (not shown). The pinion engaged in the rack 8 moves the arm to the left which carries the clamp and the card to the center of the shell 9 through its vertical elongated slot. At the end, the guide block 7, which supports the arm, slips down from the pinion, engaging screw shaft 6 and travels down, lowering card 1 into a pool of solder 10 held at a required temperature by heater 11. The motor stops to allow immersion of the card for a timed period and then reverses to move the card upwards in the shell. Air knives 12 and 13 direct hot air from heater 14 across the card to remove excess solder. When guide block 7 has reached its upper limit, the rack again engages the pinion (not shown), which disengages the guide block from the screw shaft. The pinion retracts the clamp and card to the right where it is cooled by an air blast from nozzle 15 supplied with cold air from compressed air source 16 through valve 17.

1

Page 2 of 2

2

[This page contains 3 pictures or other non-text objects]