Browse Prior Art Database

Interchangeable Electrical Connections for Testing Conveyor-Borne Products

IP.com Disclosure Number: IPCOM000046589D
Original Publication Date: 1983-Aug-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 61K

Publishing Venue

IBM

Related People

Johnson, LA: AUTHOR [+4]

Abstract

A product to be tested is placed in a conveyor tray 10 having a probe card holder 12. Circuit card 14 on card holder 12 is interchangeable with other circuit cards. At a test station, the tray is automatically stopped, and a probe block 20 with guide pins 22 and electrical probes 26 moves in automatically to make electrical contact between pads 24 and the spring-loaded probes 26. Electrical connection from circuit card 14 through the card holder 12 to the product under test 16 is by means of cable 17 and connector 18. Once the product under test has been mounted in the tray and plugged to the connector 18, the tray is placed on the conveyor and transported to the test station. Fig. 2 shows the relationship between a spring-loaded probe 26 and circuit card pad 24.

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Interchangeable Electrical Connections for Testing Conveyor-Borne Products

A product to be tested is placed in a conveyor tray 10 having a probe card holder 12. Circuit card 14 on card holder 12 is interchangeable with other circuit cards. At a test station, the tray is automatically stopped, and a probe block 20 with guide pins 22 and electrical probes 26 moves in automatically to make electrical contact between pads 24 and the spring-loaded probes 26. Electrical connection from circuit card 14 through the card holder 12 to the product under test 16 is by means of cable 17 and connector 18. Once the product under test has been mounted in the tray and plugged to the connector 18, the tray is placed on the conveyor and transported to the test station. Fig. 2 shows the relationship between a spring-loaded probe 26 and circuit card pad 24. If the diameter of pad 24 on card 14 is D2 and the diameter of the probe is D1, then the probe must be aligned relative to the pad within a range equal to 1/4(D2-D1). Alignment of probe block 20 to card holder 12 is accomplished by guide pins 22 and guide receptacles 28 shown in Fig. 3. If the outside diameter of conical receptor 28 is D, then the maximum misalignment between the guide pin 22 and the receptor 28 is 1/4D.

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