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Dual Pencil Ambient and Elevated Temperature Test System

IP.com Disclosure Number: IPCOM000046668D
Original Publication Date: 1983-Aug-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 47K

Publishing Venue

IBM

Related People

Frank, V: AUTHOR [+5]

Abstract

The conventional technique for carrying out the testing of some semiconductor products which require both ambient temperature and elevated temperature testing is to separately test the entire lot in two stages. Not only does this impose an excessive amount of testing time for the product, but it also exposes the product to excessive opportunities for damage through excessive handling. The dual pencil ambient and elevated temperature test system herein described overcomes these problems by carrying out both the ambient temperature test and the elevated temperature test of each semiconductor chip during a single testing interval. As shown in the figure, the testing head consists of 16 vacuum pencils, numbered 1 through 16 which correspond with 16 stations which are angularly displaced from one another by a 22¼Œ separation.

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Dual Pencil Ambient and Elevated Temperature Test System

The conventional technique for carrying out the testing of some semiconductor products which require both ambient temperature and elevated temperature testing is to separately test the entire lot in two stages. Not only does this impose an excessive amount of testing time for the product, but it also exposes the product to excessive opportunities for damage through excessive handling. The dual pencil ambient and elevated temperature test system herein described overcomes these problems by carrying out both the ambient temperature test and the elevated temperature test of each semiconductor chip during a single testing interval. As shown in the figure, the testing head consists of 16 vacuum pencils, numbered 1 through 16 which correspond with 16 stations which are angularly displaced from one another by a 221/4OE separation. The overall concept of the invention is to provide two sets of vacuum pencils. The first, odd numbered set not heated, and the second, even numbered set is heated. At the pickup station 1, an unheated, odd numbered vacuum pencil will pick up a semiconductor chip to be tested, and after two 221/4OE angular increments of the test head, the semiconductor chip will be electrically tested at the first electrical test location, at station 3, at ambient temperature. After the electrical test at the first test location is completed, the test head can increment through either one 221/4OE increment to station 4 or, alternately, through two 221/4OE increments to stati...