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Browse Prior Art Database

Temperature Control System

IP.com Disclosure Number: IPCOM000046717D
Original Publication Date: 1983-Aug-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 41K

Publishing Venue

IBM

Related People

Kane, PH: AUTHOR [+3]

Abstract

In order to detect temperature-sensitive failures in devices, electronic components, etc., being tested in an environmental chamber, it is necessary to control the temperature in the chamber very precisely. With precise temperature control, an otherwise intermittent failure can be made a solid failure. In the drawing, environmental chamber 10 can receive air from cold and hot chambers 20 and 30, respectively, which are running all the time, but can be shut off during equilibrium if necessary. All conduction paths are insulated and airflow is shown by the arrows. Sensor 15 detects environmental chamber temperature and feeds compare logic 50 which is also fed by set block 60. Set block 60 is settable to the desired temperature and predetermined high (HI) and low (LO) limits.

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Temperature Control System

In order to detect temperature-sensitive failures in devices, electronic components, etc., being tested in an environmental chamber, it is necessary to control the temperature in the chamber very precisely. With precise temperature control, an otherwise intermittent failure can be made a solid failure. In the drawing, environmental chamber 10 can receive air from cold and hot chambers 20 and 30, respectively, which are running all the time, but can be shut off during equilibrium if necessary. All conduction paths are insulated and airflow is shown by the arrows. Sensor 15 detects environmental chamber temperature and feeds compare logic 50 which is also fed by set block 60. Set block 60 is settable to the desired temperature and predetermined high (HI) and low (LO) limits. The control section of block 50 opens and closes baffles A-E inclusive. The logic for this system is shown in the table below.

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