Browse Prior Art Database

Debug Probe for Pin-Side-Probe Fixture

IP.com Disclosure Number: IPCOM000046798D
Original Publication Date: 1983-Aug-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 62K

Publishing Venue

IBM

Related People

Uplinger, KA: AUTHOR

Abstract

The debug probe significantly reduces debug time on all products during logic test and provides the key to development of an automated debug process. Current test equipment for electronic devices commonly use probes to check the card-under-test (CUT) during the test. These probes typically use a spring-loaded pin head mounted inside a sleeve. As the CUT is pressed against the probes, the spring is compressed and electrical contact is made. The increasing density of electronics into smaller spaces results in the increasing number of test probes per CUT and the increasing operator debug time, which directly affects the eventual cost of the product. Automatic debug processes are being developed and are necessary to maintain cost effective products in the market.

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Debug Probe for Pin-Side-Probe Fixture

The debug probe significantly reduces debug time on all products during logic test and provides the key to development of an automated debug process. Current test equipment for electronic devices commonly use probes to check the card-under-test (CUT) during the test. These probes typically use a spring- loaded pin head mounted inside a sleeve. As the CUT is pressed against the probes, the spring is compressed and electrical contact is made. The increasing density of electronics into smaller spaces results in the increasing number of test probes per CUT and the increasing operator debug time, which directly affects the eventual cost of the product. Automatic debug processes are being developed and are necessary to maintain cost effective products in the market. Unfortunately, these processes require the ability to probe all points on the CUT. The pin-side-probe fixture currently supports only 480 test points of a possible 5600. One of the limiting factors is that each probe typically exerts 4 ounces of pressure on the CUT for a total pressure of 120 pounds. Placing a probe in all possible debug locations (5600) would result in a force well over 1000 pounds on the CUT, a prohibitively excessive amount. Reducing the spring pressure would result in erratic contact problems. Obviously, a method is needed to keep the pressure on the CUT to an acceptable level while maintaining full accessibility. A solution of this dilemma is the...