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Browse Prior Art Database

High Frequency Probe

IP.com Disclosure Number: IPCOM000046825D
Original Publication Date: 1983-Aug-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 22K

Publishing Venue

IBM

Related People

Kolesar, MJ: AUTHOR [+2]

Abstract

A probe for measuring characteristic impedance Zo with reduced rise time and minimized distortion can be constructed from rigid coaxial cable having an attached, flexible ground contact. Referring to the figure, rigid coaxial cable 1 is cut to permit center conductor 2 to protrude as a contact. The resilient ground conductor 4, such as beryllium copper, is inserted between the outer insulation and outer conductor in frictional contact therewith. Conductor 4 passes through a hole in nylon collar 5 to maintain spacing relative to the center conductor 2. The conductor is looped at 6 to accommodate flexing as the conductor moves axially in the collar. Heat-shrinkable insulative tubing 7 is placed on the coaxial cable 1 at both sides of collar 5, and a short piece of tubing 8 is added to the ground conductor 4.

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High Frequency Probe

A probe for measuring characteristic impedance Zo with reduced rise time and minimized distortion can be constructed from rigid coaxial cable having an attached, flexible ground contact. Referring to the figure, rigid coaxial cable 1 is cut to permit center conductor 2 to protrude as a contact. The resilient ground conductor 4, such as beryllium copper, is inserted between the outer insulation and outer conductor in frictional contact therewith. Conductor 4 passes through a hole in nylon collar 5 to maintain spacing relative to the center conductor 2. The conductor is looped at 6 to accommodate flexing as the conductor moves axially in the collar. Heat-shrinkable insulative tubing 7 is placed on the coaxial cable 1 at both sides of collar 5, and a short piece of tubing 8 is added to the ground conductor 4.

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