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Automated Probe Contact for Subassembly Test

IP.com Disclosure Number: IPCOM000046995D
Original Publication Date: 1983-Sep-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 44K

Publishing Venue

IBM

Related People

Askew, JC: AUTHOR [+3]

Abstract

A subassembly to be tested is placed in a test fixture. Test probes are moved to contact electrical pins on the subassembly. As the probes move forward, a guide automatically registers the card carrying the pins relative to the test probes. At the same time, an optical read head scans the subassembly to identify the subassembly being tested. In Fig. 1, subassembly 10, containing electrical circuit card 12 with electric pins 14, is to be tested. Electrical test probes 16 are carried by carriage 18 mounted on slide 20. Carriage 18 is moved forward by pneumatic piston 22. As carriage 18 moves forward, it carries an optical mark-reading head 24 that scans identification marks on the side of subassembly 10. A side view of the test fixture is shown in Fig. 2. The position of subassembly 10 is shown in dashed lines.

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Automated Probe Contact for Subassembly Test

A subassembly to be tested is placed in a test fixture. Test probes are moved to contact electrical pins on the subassembly. As the probes move forward, a guide automatically registers the card carrying the pins relative to the test probes. At the same time, an optical read head scans the subassembly to identify the subassembly being tested. In Fig. 1, subassembly 10, containing electrical circuit card 12 with electric pins 14, is to be tested. Electrical test probes 16 are carried by carriage 18 mounted on slide 20. Carriage 18 is moved forward by pneumatic piston 22. As carriage 18 moves forward, it carries an optical mark-reading head 24 that scans identification marks on the side of subassembly 10. A side view of the test fixture is shown in Fig. 2. The position of subassembly 10 is shown in dashed lines. Optical mark reader 24 and guide member 26 for pins 16 (Fig. 1) are visible in Fig. 2. As carriage 18 moves forward, the mark reader scans marks on the side of subassembly 10. At the same time, guide member 26, which is notched at area 28, moves forward and engages the edge 30 of card 12. By engaging the edge of card 30, guide 28 vertically registers the card 12 so that pins 14 will be in the same plane as probes 16 (Fig. 1). Probes 16 are spring- loaded so as to take up any slight variation in length by electrical contact pins 14 on card 12.

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