Browse Prior Art Database

Wire-Lapping Device

IP.com Disclosure Number: IPCOM000047185D
Original Publication Date: 1983-Oct-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 44K

Publishing Venue

IBM

Related People

Chapin, FW: AUTHOR [+2]

Abstract

The ends of a plurality of probes can be minimally lapped to lie in a common plane by using the lapping plate as part of a continuity circuit. Referring to the figure, a test head 1 having a plurality of wire probes 2 is suitably secured in mounting plate 3. Plate 3 moves vertically on guide posts 4 fixed in base 5 and is resiliently supported on springs 6. Base 5 has a recess 7 for receiving lapping plate 8 supported on an air film supplied from a pressurized source to ducts 9. Lapping plate 8 has a diamond coating and is grounded at 10. The plate is reciprocated in the recess by motor 18 driving eccentric disk 11 and pitman 12. A cable 13 from a continuity checking circuit, with respective indicator lamps (not shown) for each probe, connects with the tops of probes 2 via plug 14.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 2

Wire-Lapping Device

The ends of a plurality of probes can be minimally lapped to lie in a common plane by using the lapping plate as part of a continuity circuit. Referring to the figure, a test head 1 having a plurality of wire probes 2 is suitably secured in mounting plate 3. Plate 3 moves vertically on guide posts 4 fixed in base 5 and is resiliently supported on springs 6. Base 5 has a recess 7 for receiving lapping plate 8 supported on an air film supplied from a pressurized source to ducts 9. Lapping plate 8 has a diamond coating and is grounded at 10. The plate is reciprocated in the recess by motor 18 driving eccentric disk 11 and pitman 12. A cable 13 from a continuity checking circuit, with respective indicator lamps (not shown) for each probe, connects with the tops of probes 2 via plug
14. Test head 1 is then initially coarsely adjusted by knob 15 acting through wedge 16 to urge the probes toward the lapping plate. When any probe ends indicate contact, fine adjustment knob 17 is used to slowly feed the test head probes against the lapping plate. Lapping continues until all probes indicate contact with the plate.

1

Page 2 of 2

2

[This page contains 3 pictures or other non-text objects]