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Browse Prior Art Database

Bi-Level Probes

IP.com Disclosure Number: IPCOM000047411D
Original Publication Date: 1983-Nov-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 29K

Publishing Venue

IBM

Related People

Sternbach, IC: AUTHOR

Abstract

This test probe 10 will permit testing of connections on a circuit board 12 with or without circuit elements 14 plugged into the board. When the elements 14 are plugged into the board, the spring-loaded probe 16 retracts into the test head under the force exerted on them by the tops of the elements 14. When there are no elements, all the probes 16 contact the board to perform electrical test.

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Bi-Level Probes

This test probe 10 will permit testing of connections on a circuit board 12 with or without circuit elements 14 plugged into the board. When the elements 14 are plugged into the board, the spring-loaded probe 16 retracts into the test head under the force exerted on them by the tops of the elements 14. When there are no elements, all the probes 16 contact the board to perform electrical test.

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