Browse Prior Art Database

Card Thermal Stress Tester

IP.com Disclosure Number: IPCOM000047477D
Original Publication Date: 1983-Nov-01
Included in the Prior Art Database: 2005-Feb-07
Document File: 2 page(s) / 56K

Publishing Venue

IBM

Related People

Gaunt, DS: AUTHOR

Abstract

Thermal cycling and burn-in of individual modules on a card at their optimum stress level, rather than stressing the whole card at a level determined by the worst-case module, is achieved by apparatus which is programmed to direct jets of hot or cold air selectively onto the components. Where cards, installed in a unit, are accessible from the outside, in situ stress testing can be performed with suitably modified apparatus. A schematic diagram of the thermal stress tester is shown in the figure. The tester consists of a plenum 1 having an air inlet 2 from a hot or cold switchable air supply (not shown), and an air outlet 3. The plenum is internally structured with an inlet chamber 4 and an outlet chamber 5, communication between the two being via a number of regularly spaced holes in a plenum orifice plate 7.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 56% of the total text.

Page 1 of 2

Card Thermal Stress Tester

Thermal cycling and burn-in of individual modules on a card at their optimum stress level, rather than stressing the whole card at a level determined by the worst-case module, is achieved by apparatus which is programmed to direct jets of hot or cold air selectively onto the components. Where cards, installed in a unit, are accessible from the outside, in situ stress testing can be performed with suitably modified apparatus. A schematic diagram of the thermal stress tester is shown in the figure. The tester consists of a plenum 1 having an air inlet 2 from a hot or cold switchable air supply (not shown), and an air outlet 3. The plenum is internally structured with an inlet chamber 4 and an outlet chamber 5, communication between the two being via a number of regularly spaced holes in a plenum orifice plate 7. Card guides 8 in the outlet chamber 5 are provided to support a card 9 under test in front of the plate 7. A roller blind 10 of flexible plastics material is supported on motorized rollers 11 and guide rollers 12 to extend over the surface of the orifice plate 7. The roller blind is provided with a different pattern of holes 13 for each card type to be tested, the size and position of the holes of each pattern being shown to suit the requirements of the associated card. Thus, in the figure, holes are only provided in the roller blind at those locations aligned with a module 14 on the card. Further, the size of the holes 13 are sel...