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Conformal Multi-Probe Tester Assembly

IP.com Disclosure Number: IPCOM000048131D
Original Publication Date: 1981-Dec-01
Included in the Prior Art Database: 2005-Feb-08
Document File: 2 page(s) / 75K

Publishing Venue

IBM

Related People

Powell, DO: AUTHOR [+2]

Abstract

Probe assembly 10 (Fig. 1) has a flexible elastomer matrix that allows its contact surface 11 to conform to the metallized surface A of the substrate S to be electrically tested.

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Conformal Multi-Probe Tester Assembly

Probe assembly 10 (Fig. 1) has a flexible elastomer matrix that allows its contact surface 11 to conform to the metallized surface A of the substrate S to be electrically tested.

The assembly 10 has a pair of elastomer members 12, 13 through which pass a high density array of insulated probe wire conductors 14. A pair of rigid parallel mounted plate members 15, 16, each with a corresponding array of precision located openings in alignment with the other, maintain the conductors 14 in their appropriate spatial relationships which are correlated with the testing sites of the circuit pattern on the substrate surface A. Assembly 10 is affixed to a hollow sleeve like piston 17 located in air cylinder 18 and is pneumatically operated to position the assembly 10 so that its surface 11 is placed in contact with surface A of substrate S mounted in the test station beneath it.

When placed in contact with the surface A. the conductors 14 can deflect laterally and/or vertically in the elastomer matrix 12-13. As a result, an appropriate contact pressure with the test pads of the substrate circuit pattern on surface A is maintained even when the elastomer members 12, 13 conformally deflect because of the height and/or any irregularities or discrepancies therein of the test pads and/or because of any surface irregularities in the surface A per se.

The assembly 10 is easily fabricated (Figs. 2A-2C). The insulated wire conductors 14 are threaded through the aligned holes of precision wire guides 15, 16 and 19 (Fig....