Browse Prior Art Database

MR Element Position Detector

IP.com Disclosure Number: IPCOM000049808D
Original Publication Date: 1982-Jul-01
Included in the Prior Art Database: 2005-Feb-09
Document File: 2 page(s) / 32K

Publishing Venue

IBM

Related People

Sharma, BS: AUTHOR [+4]

Abstract

The distance between the magnetoresistive (MR) element and the ferrite closure can be obtained by depositing a conductor layer onto the surface of the ferrite closure and measuring the electrical capacitance between the conductive layer and the MR element.

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MR Element Position Detector

The distance between the magnetoresistive (MR) element and the ferrite closure can be obtained by depositing a conductor layer onto the surface of the ferrite closure and measuring the electrical capacitance between the conductive layer and the MR element.

As shown in the figure, a layer of an insulative material, such as alumina, shown by reference numeral 1, is deposited onto a substrate 2 of a ferrite material. An MR element 3 of a nickel-iron material is then deposited onto the alumina layer 1. A second alumina layer 4 insulates the MR layer 3 from the closure ferrite piece 5. To accomplish the measurement of the distance between the closure ferrite piece 5 and the MR element 3, a thin layer 6 of a conductive material, such as Bold, is deposited onto the surface of the ferrite closure 5. The capacitance field between the MR element 3 and the conductor 6 can then be measured to provide the effective gap distance as an average of the distances between the two metallic layers.

A conductor layer can be deposited onto the ferrite substrate 2 to use a capacitance field to measure the distance between that layer and the MR element 3 in the event that gap distance needs to be measured. Further, distances between the ferrite pieces can be determined by depositing a conductor layer onto each of the ferrite surfaces prior to the bonding together of the ferrite pieces by glass, for instance. As before, the capacitance field will give an avera...