Browse Prior Art Database

Master Standard for Energy X-Ray Analysis

IP.com Disclosure Number: IPCOM000052147D
Original Publication Date: 1981-May-01
Included in the Prior Art Database: 2005-Feb-11
Document File: 2 page(s) / 50K

Publishing Venue

IBM

Related People

Cain, JF: AUTHOR

Abstract

The present method eliminates the use of different standards used to measure elemental concentrations in a sample composition and provides a foundation for communicating data among various remote locations and permits comparison of techniques and instrumentation. For example, all analytical facilities within a corporation may be provided with a standard which is made from the same melt.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 76% of the total text.

Page 1 of 2

Master Standard for Energy X-Ray Analysis

The present method eliminates the use of different standards used to measure elemental concentrations in a sample composition and provides a foundation for communicating data among various remote locations and permits comparison of techniques and instrumentation. For example, all analytical facilities within a corporation may be provided with a standard which is made from the same melt.

As shown, a "mother" standard is provided which comprises an aluminum housing having mounted therein a plurality of cylindrical solid columns of a known composition surrounded by a suitable epoxy material which fills the housing. In the example shown, the columns are solder alloys used in various processes for a number of products.

The homogeneous lead alloy mixture is quenched from liquidus in cast form using a non-reactive mold, such as glass, or the like.

The design is such that thin wafers having a thickness of approximately 1/10" are sliced and removed from the "mother" standard for distribution. Prior to the removal of such wafers, the exposed end of the standard or mount is ground and polished to remove any scratches, or the like. Each wafer is coated on the back side with evaporated metal, such as carbon, gold, aluminum, etc., to serve as a backing means to discharge the electron charge from an energy source, such as an electron micro-probe. X-rays are created for measurement purposes. All of the samples in the "mother" standard ar...