Browse Prior Art Database

Combined Multi Corner Testing With Time and or Voltage Modulation

IP.com Disclosure Number: IPCOM000053072D
Original Publication Date: 1981-Aug-01
Included in the Prior Art Database: 2005-Feb-12
Document File: 3 page(s) / 34K

Publishing Venue

IBM

Related People

Prilik, RJ: AUTHOR

Abstract

This article describes a combined multi-corner testing apparatus with time and voltage modulation to eliminate long test times for very large scale integrated circuit devices employing separate voltage and frequency corners and merging analog and digital test procedures.

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Combined Multi Corner Testing With Time and or Voltage Modulation

This article describes a combined multi-corner testing apparatus with time and voltage modulation to eliminate long test times for very large scale integrated circuit devices employing separate voltage and frequency corners and merging analog and digital test procedures.

The semiconductor test system functional architecture is shown in the figure and includes a CPU 11 coupled to a microcode and sequence circuit 12 which feeds a pattern generator 13, a controller 18 and a pattern store circuit 14. The patent store circuit is often combined with a period/rate generator 16, timing generators 17 and pin-electronics 19. These pin-electronic devices further consist of driver/detector program current loads, a plurality of device power supplies 21, ground reference circuit 24 and a level control 25. The power supply and the pin-electrics can employ both of these current loads and ground reference circuits.

The modulation pattern store 14 further consists of a plurality of parallel memory elements of multiple address store which is the essence of this invention.

For example, in this modulation pattern store each prime architectural unit can be modulated by a value in time and or voltage and applied to the device 10 under test. Normal "nominal' parameters are pre-programmed by set-up control registers 18 after which each modulation pattern store memory may be sequenced by microcode to mathematically sum at the summing circuits 15 an offset value to each functional unit equal to the values stored in the memory at the modulation and pattern store circuit 14. In this manner "modulate' set-up control values at 18 are set forth in arbitrary sequence stored at 4 and controlled by the sequence 12.

It should be noted that an analog waveform function generator could replace digital memory pattern store 14, indicating that the signals summed by the summers 15 may be either analog or digital in nature with the origin of the modulating source at 14 in either analog, digital or mixed form.

In the typical four-corner voltage/frequency plot of a device under test, each voltage/frequency corner is independently selected by a part number program with all functional test patterns being repeated for each corner. There is little or no dynamic selection or change to voltage or time variables in real time from one test cycle to the next while executing such a functional test pattern.

Dynamic arbitrary waveforms are not normally...