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Detection of Skew and Shift of CCD Sensor Array

IP.com Disclosure Number: IPCOM000060162D
Original Publication Date: 1986-Mar-01
Included in the Prior Art Database: 2005-Mar-08
Document File: 2 page(s) / 47K

Publishing Venue

IBM

Related People

Ishikawa, Y: AUTHOR

Abstract

This article describes a technique for detecting skew and shift of a one-dimensional charge coupled device (CCD) sensor array from its nominal mounting position. A composite test pattern consisting of a sawtooth-like pattern and two vertical bars provided at the opposite ends of the sawtooth-like pattern is used. The composite test pattern enables quantitative measurement of skew and shift of the CCD sensor array. Fig. 1 illustrates the present test arrangement. Test chart 2 has a composite test pattern consisting of a sawtooth-like pattern 3 and two vertical bars 4 provided at the opposite ends of the sawtooth-like pattern 3. Under illumination by light source l, the test pattern is sensed by one-dimensional sensor array 6 through lens system 5. Fig.

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Detection of Skew and Shift of CCD Sensor Array

This article describes a technique for detecting skew and shift of a one- dimensional charge coupled device (CCD) sensor array from its nominal mounting position. A composite test pattern consisting of a sawtooth-like pattern and two vertical bars provided at the opposite ends of the sawtooth-like pattern is used. The composite test pattern enables quantitative measurement of skew and shift of the CCD sensor array. Fig. 1 illustrates the present test arrangement. Test chart 2 has a composite test pattern consisting of a sawtooth-like pattern 3 and two vertical bars 4 provided at the opposite ends of the sawtooth-like pattern
3. Under illumination by light source l, the test pattern is sensed by one- dimensional sensor array 6 through lens system 5. Fig. 2 illustrates skew and shift of the sensor array relative to the test pattern, and the output pulse pattern from the sensor array. X' - Y' indicates position of the sensor array skewed and shifted from the nominal X - Y position on the test chart 2. Skew Wr is obtained by the following equation in accordance with the geometric analysis shown in Fig.
3.

(Image Omitted)

where d is distance between slanted portions of the sawtooth pattern and represented by 2P cos (2P is the length of the vertical portion of the sawtooth pattern, and is the angle of the slanted portion with X axis). In the equation, P1P3 is the length between points Pl and P3 on the test chart 2, while...