Browse Prior Art Database

Sequential High Voltage Probe Tester

IP.com Disclosure Number: IPCOM000060304D
Original Publication Date: 1986-Mar-01
Included in the Prior Art Database: 2005-Mar-08
Document File: 2 page(s) / 59K

Publishing Venue

IBM

Related People

Busshart, LR: AUTHOR [+2]

Abstract

Because interlocked perimeter shields must be deactivated and the high voltage probe remains recessed within the probe assembly until all safety conditions are met, a manual high voltage test is able to be performed without shock hazard. The fail-safe system is accomplished through the combined use of a proximity sensor, a negative pressure sensor, and an indexing solenoid. Referring to Fig. 1, placing the test head assembly 1 into position causes vacuum ports 2 to close, which in turn closes vacuum sensor switch 3, allowing part of the system interlock to deactivate. This step assures pre-test positioning of the test head. Referring to Fig. 2, the balance of interlock deactivation is determined by a proximity sensor 6.

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Sequential High Voltage Probe Tester

Because interlocked perimeter shields must be deactivated and the high voltage probe remains recessed within the probe assembly until all safety conditions are met, a manual high voltage test is able to be performed without shock hazard. The fail-safe system is accomplished through the combined use of a proximity sensor, a negative pressure sensor, and an indexing solenoid. Referring to Fig. 1, placing the test head assembly 1 into position causes vacuum ports 2 to close, which in turn closes vacuum sensor switch 3, allowing part of the system interlock to deactivate. This step assures pre-test positioning of the test head. Referring to Fig. 2, the balance of interlock deactivation is determined by a proximity sensor 6. At no time will the system be readied for a test if a person or object is intruding into the operator working station. This step assures that the operator is at a safe distance from all high voltage. As shown in Fig. 1, when total interlock deactivation is in effect, the indexing solenoid causes the test probe to extend into the test position 5 with the applied voltage.

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