Browse Prior Art Database

Tailorable Bring-Up Diagnostics for a Featurable Workstation

IP.com Disclosure Number: IPCOM000060506D
Original Publication Date: 1986-Apr-01
Included in the Prior Art Database: 2005-Mar-08
Document File: 2 page(s) / 72K

Publishing Venue

IBM

Related People

Fredericksen, JK: AUTHOR [+3]

Abstract

Through the use of Non-Volatile RAM (NVRAM), a workstation can be configured to run specific feature diagnostics each time power is turned on. The configuration is updated directly by the operator through a select option utility and can be used to bypass a feature with known problems or a feature whose diagnostic tests may be time consuming to run every time the workstation is powered on. NVRAM storage is allocated to store test status flags. These flags are updated via a ROM-resident select option invoked by the operator. As shown in Fig. 1, each status flag represents a specific feature. Later, when the "Feature Diagnostic Driver" runs, the status flags are tested one at a time. If the bit corresponding to any feature is active, that feature diagnostic will be invoked each time the workstation is powered on.

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Tailorable Bring-Up Diagnostics for a Featurable Workstation

Through the use of Non-Volatile RAM (NVRAM), a workstation can be configured to run specific feature diagnostics each time power is turned on. The configuration is updated directly by the operator through a select option utility and can be used to bypass a feature with known problems or a feature whose diagnostic tests may be time consuming to run every time the workstation is powered on. NVRAM storage is allocated to store test status flags. These flags are updated via a ROM-resident select option invoked by the operator. As shown in Fig. 1, each status flag represents a specific feature. Later, when the "Feature Diagnostic Driver" runs, the status flags are tested one at a time. If the bit corresponding to any feature is active, that feature diagnostic will be invoked each time the workstation is powered on. Each block in Fig. 1 is a block of microcode (a program) with the exceptions of the POR (power-on-reset) block and the NVRAM storage. POR is included in the figure to show the starting point. The base diagnostic tests 10 execute every time. They are self- contained and cannot be bypassed. The select option driver 12 is a block of microcode that checks to see if a select option is requested. If one is, it is invoked. If not, the driver is exited. The driver is entered every power on. The feature diagnostic driver 13, shown in detail in Fig. 2, works the same way. It only checks to see what features...