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Thermally Modulated Electrical Resistivity

IP.com Disclosure Number: IPCOM000060629D
Original Publication Date: 1986-Mar-01
Included in the Prior Art Database: 2005-Mar-09
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

DiStefano, TH: AUTHOR [+3]

Abstract

Local probing by means of a small heat source detects and locates incipient defects in conductors, connectors, etc. in all circuits including circuits containing magnetic and/or semiconductor nonlinear components.

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Thermally Modulated Electrical Resistivity

Local probing by means of a small heat source detects and locates incipient defects in conductors, connectors, etc. in all circuits including circuits containing magnetic and/or semiconductor nonlinear components.

In operation, the scanning of a circuit with a thermally modulated stimulus modulates the local resistivity, local linear resistance and overall circuit resistance. The thermal modulation is able to be accomplished by light choppers or other similar thermal varying means. By monitoring the electrical resistance of the circuit under thermal stimulation, any change in modulation indicates an unexpected ohmic change in the conductor and hence a possible defect. A phase sensitive detec synchronized with the thermal stimulus is used to detect the changes caused by the defect. Various modulation, mixing and heterodyne techniques can be used produce a signal with a distinctive frequency and phase.

Disclosed anonymously.

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