Browse Prior Art Database

Multi-Path Impression Comparator

IP.com Disclosure Number: IPCOM000061196D
Original Publication Date: 1986-Jul-01
Included in the Prior Art Database: 2005-Mar-09
Document File: 2 page(s) / 50K

Publishing Venue

IBM

Related People

Clark, J: AUTHOR [+2]

Abstract

This article describes a portable microprocessor-controlled troubleshooting system for use in detecting and analyzing functional failures on logic modules used on electronic logic printed circuit card assemblies. The system is comprised of four functional sections described as the input function, output function, processor function, and the memory function. The system utilizes the commonly known method of comparing test patterns on failed logic modules on logic card assemblies and known good logic modules on logic card assemblies. Briefly, the test system will sample the DC voltage signals at the input and outputs of a logic module at a point of failure and store the data in memory. The tester then samples the same module of a good card comparing the stored data against that of the good module.

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Multi-Path Impression Comparator

This article describes a portable microprocessor-controlled troubleshooting system for use in detecting and analyzing functional failures on logic modules used on electronic logic printed circuit card assemblies. The system is comprised of four functional sections described as the input function, output function, processor function, and the memory function. The system utilizes the commonly known method of comparing test patterns on failed logic modules on logic card assemblies and known good logic modules on logic card assemblies. Briefly, the test system will sample the DC voltage signals at the input and outputs of a logic module at a point of failure and store the data in memory. The tester then samples the same module of a good card comparing the stored data against that of the good module. The memory function of the tester results in allowing true portability and ease of testing without requiring full card assembly and sampling equipment for comparison. The figure shows test system 11 sampling logic module 12 and having an input section, shown generally as 13, output section 14, control section 15, and memory storage 16, all receiving power from power supply 17. The input section is comprised of probe gun 18 and analog-to-digital converter (ADC) 20, probe gun 18 having a module head with a plurality of input pins for interfacing with module 12. Output section 14 is a light-emitting diode (LED)-type display having a plurality of readout characters for showing the address of the failed input or output line of module 12. The control section is comprised of a microprocessor 22 having a control log...