Browse Prior Art Database

Application of Micro-Kerr Measurement Technique for Monitoring and Characterizing Magnetic Thin-Film Wafers and Similar Structures

IP.com Disclosure Number: IPCOM000061239D
Original Publication Date: 1986-Jul-01
Included in the Prior Art Database: 2005-Mar-09
Document File: 1 page(s) / 11K

Publishing Venue

IBM

Related People

Bartels, C: AUTHOR [+2]

Abstract

It is known from the literature to observe magnetic domains and their switching behavior under the influence of an induced magnetic field by means of the magneto-optical kerr (Micro-Kerr) effect. Micro-Kerr permits making domain patterns visible by photographic and/or video techniques. It has been found that domain patterns are correlated with the magnetic read/write performance of thin-film heads. Micro-Kerr may therefore be used as a test means at an early stage in the production of thin-film magnetic heads to monitor single magnetic layers as well as completed head elements. It may also be used for other magnetic components or parts thereof.

This text was extracted from a PDF file.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 1

Application of Micro-Kerr Measurement Technique for Monitoring and Characterizing Magnetic Thin-Film Wafers and Similar Structures

It is known from the literature to observe magnetic domains and their switching behavior under the influence of an induced magnetic field by means of the magneto-optical kerr (Micro-Kerr) effect. Micro-Kerr permits making domain patterns visible by photographic and/or video techniques. It has been found that domain patterns are correlated with the magnetic read/write performance of thin- film heads. Micro-Kerr may therefore be used as a test means at an early stage in the production of thin-film magnetic heads to monitor single magnetic layers as well as completed head elements. It may also be used for other magnetic components or parts thereof. The Micro-Kerr technique thus applied avoids having to evaluate the magnetic read/write performance of completed magnetic heads in a head/ disk assembly by early process controls on partially completed or completed thin-film head element structures.

1