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Diagnostic Program for Stuck Faults

IP.com Disclosure Number: IPCOM000062528D
Original Publication Date: 1986-Dec-01
Included in the Prior Art Database: 2005-Mar-09
Document File: 2 page(s) / 41K

Publishing Venue

IBM

Related People

Floyd, RK: AUTHOR [+2]

Abstract

A method is described and illustrated which permits a list of 'prime' stuck faults to be generated for a very large scale integrated circuit chip. 2 p. Diagnostic programs for testing circuits on chips generally list all possible stuck faults in the sensitized path as possible causes of the failure. Prior methods did not filter these stuck faults and come up with a 'prime' stuck fault list. This method uses the fact that an automatic test pattern generation program will list all stuck faults sensitized by each test pattern rather than listing only stuck faults sensitized for the first time only. The method uses the fact that faults generally show up at different sample points on the chip to correlate the fails in order to come up with a list of fails that correlate across the failing test patterns.

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Diagnostic Program for Stuck Faults

A method is described and illustrated which permits a list of 'prime' stuck faults to be generated for a very large scale integrated circuit chip. 2 p. Diagnostic programs for testing circuits on chips generally list all possible stuck faults in the sensitized path as possible causes of the failure. Prior methods did not filter these stuck faults and come up with a 'prime' stuck fault list. This method uses the fact that an automatic test pattern generation program will list all stuck faults sensitized by each test pattern rather than listing only stuck faults sensitized for the first time only. The method uses the fact that faults generally show up at different sample points on the chip to correlate the fails in order to come up with a list of fails that correlate across the failing test patterns. The flowchart shows the basic functions of the program.

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