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Go No Go Times Circuit

IP.com Disclosure Number: IPCOM000073491D
Original Publication Date: 1970-Dec-01
Included in the Prior Art Database: 2005-Feb-22
Document File: 2 page(s) / 28K

Publishing Venue

IBM

Related People

Grubel, SJ: AUTHOR [+2]

Abstract

Described is an electrical measuring arrangement for determining transient or dynamic characteristics of electrical systems, e.g., integrated logic devices, transistors, and the like, where the times of delay, rise, turnon, storage and turnoff times within which the system responds are significantly important.

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Go No Go Times Circuit

Described is an electrical measuring arrangement for determining transient or dynamic characteristics of electrical systems, e.g., integrated logic devices, transistors, and the like, where the times of delay, rise, turnon, storage and turnoff times within which the system responds are significantly important.

Referring to the diagram, a tunnel diode discriminator compares the level of a test signal input with a reference signal level at the time of strobe signal occurrence. The discriminator is connected to a detector circuit, which senses the change in state of the tunnel diode and passes this information as an output signal and, furthermore, provides a feedback reset signal to the discriminator. The output of the detector stage is introduced into a voting logic circuit which examines the frequency of discriminator ON cycles and makes a go/no-go decision based on a predetermined frequency.

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