Browse Prior Art Database

Orbiting Prose

IP.com Disclosure Number: IPCOM000073531D
Original Publication Date: 1970-Dec-01
Included in the Prior Art Database: 2005-Feb-22
Document File: 3 page(s) / 65K

Publishing Venue

IBM

Related People

Wagner, JW: AUTHOR [+2]

Abstract

In testing integrated circuit chips, conventional practice is to monitor the conductive pads or contacts adjacent the periphery of the chip while supplying power to the chip. Many times it is desirable to probe the output of a single device located in the central portion of the chip while simultaneously monitoring the signal or output from the normal pads or contacts adjacent the periphery. This apparatus permits simultaneous monitoring of any desired portion of the chip while making normal contact by other apparatus with the peripheral pad portions.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 53% of the total text.

Page 1 of 3

Orbiting Prose

In testing integrated circuit chips, conventional practice is to monitor the conductive pads or contacts adjacent the periphery of the chip while supplying power to the chip. Many times it is desirable to probe the output of a single device located in the central portion of the chip while simultaneously monitoring the signal or output from the normal pads or contacts adjacent the periphery. This apparatus permits simultaneous monitoring of any desired portion of the chip while making normal contact by other apparatus with the peripheral pad portions.

A probe 10 is shown mounted on a pair of insulators 11 which are coupled together by parallel leaf springs 12. One of the insulators is connected to an offset bar 13 which is coupled to a cam block 14 and slidably disposed in a housing 15 by a pin 16 and slot 17 in the cam 14. The bar 13 and thus the probe 10 is capable of vertical movement as will be more fully explained.

To permit both longitudinal and orbital displacement of the probe 10 relative to an integrated circuit chip, an adjustment of the housing 15 about a floating pivot 18 is provided. The housing 15 includes a longitudinal extension 19 which is movable in both the axial and rotational direction about the pivot 18, the pivot being secured through a longitudinal slot 18A to a clamp 20 mounted in any convenient location such as superimposed on the normal TAC ring.

To effect longitudinal motion of the housing 15 and thus the probe 10, a knob 21 is connected to a cam 22 housed in the extension 19. The cam has an offset or eccentrically mounted pin 23 which extends through a horizontal portion 20A of the clamp 20. As shown in Sketch B, the horizontal portion 20A has a slot 24 in which the pin 23 rides, restricting the motion...