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Testing Scheme Using Schottky Barrier Diodes

IP.com Disclosure Number: IPCOM000073589D
Original Publication Date: 1971-Jan-01
Included in the Prior Art Database: 2005-Feb-22
Document File: 2 page(s) / 38K

Publishing Venue

IBM

Related People

Wu, WW: AUTHOR

Abstract

Schottky barrier diodes 10 are placed in shunt with transistors 12 to enable accurate testing of resistors 14. Testing currents for resistors 14 pass through the transistors 12 because monolithic circuit modules do not contain enough input pins to test the resistors 14 separately. Thus the characteristics and variability of transistors 12 would effect the results of the test making accurate measurement of resistors 14 impossible. To overcome this, Schottky barrier diodes 10 are placed in shunt with transistors 12. During normal operation of the circuit the Schottky barrier diodes are back biased.

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Testing Scheme Using Schottky Barrier Diodes

Schottky barrier diodes 10 are placed in shunt with transistors 12 to enable accurate testing of resistors 14. Testing currents for resistors 14 pass through the transistors 12 because monolithic circuit modules do not contain enough input pins to test the resistors 14 separately. Thus the characteristics and variability of transistors 12 would effect the results of the test making accurate measurement of resistors 14 impossible. To overcome this, Schottky barrier diodes 10 are placed in shunt with transistors 12. During normal operation of the circuit the Schottky barrier diodes are back biased. However, when it is desired to test the value of resistors 14, a reverse direction current is passed through the resistors causing the Schottky barrier diodes 10 to conduct prior to that of transistors 12, thereby eliminating the transistors from the test circuit.

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