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Browse Prior Art Database

Microprobe

IP.com Disclosure Number: IPCOM000074424D
Original Publication Date: 1971-Apr-01
Included in the Prior Art Database: 2005-Feb-23
Document File: 2 page(s) / 39K

Publishing Venue

IBM

Related People

Boucher, JN: AUTHOR [+2]

Abstract

This microprobe allows high-frequency measurement at a particular point in a circuit, while allowing a current return path through ground at varying distances from the contact point and effectively maintaining constant impedance in the probe.

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Microprobe

This microprobe allows high-frequency measurement at a particular point in a circuit, while allowing a current return path through ground at varying distances from the contact point and effectively maintaining constant impedance in the probe.

The body of the probe consists of fixed portion 1 and sliding bar 2 both constructed of solid brass. Adjustment screw 3 allows the positioning of ground contact 4 at any desired distance from probe tip 5. The entire assembly is mounted on a standard coaxial connector 6. Probe tip 5 is mounted in fixed portion 1 as shown at B. Polyethylene 7 insulates probe tip 5 from copper shield 8 which in turn is soldered to fixed portion 1. An air space 9 is provided between connector 6 and fixed portion 1 to match the impedance of the probe to that of connector 6.

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