Browse Prior Art Database

Auto Test CPU Interface

IP.com Disclosure Number: IPCOM000074480D
Original Publication Date: 1971-Apr-01
Included in the Prior Art Database: 2005-Feb-23
Document File: 3 page(s) / 43K

Publishing Venue

IBM

Related People

Davis, TH: AUTHOR [+2]

Abstract

Computers are automatically tested by a computer controlled adapter which is specially attached to the probe side of a circuit board in the computer to be tested and includes simulation of console switch operations and monitoring of console indicators.

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Auto Test CPU Interface

Computers are automatically tested by a computer controlled adapter which is specially attached to the probe side of a circuit board in the computer to be tested and includes simulation of console switch operations and monitoring of console indicators.

The computer 10 to be tested includes a console 11 with a multiplicity of console switches and indicators, not shown. Test adapter 12 which could be self- contained or controlled by yet another computer is coupled to 10 via multilead cable 13. The operation of 12 would be to automatically sequence through a test of all OP codes, the arithmetic logic units, basic data flow and core memory. Adapter 12 can also provide automatic program loading without I/O. These tests are performed so as to simulate the operation of the console switch functions and to monitor the console indicators. The overall test simulates an operator following an intricate test procedure at 11, except that automated testing is performed at electronic speeds without any operator intervention during the test. Tester cable 13 is attached to the probe side of circuit board 14 by of fixture 15 which is clamped over the appropriate cards on 14. Although shown in an internal position, the frame of 14 frequently is mounted so that it can be slid or swung outwardly from 10 to facilitate access. Fixture 15 can include a series of individual cable connectors such as 16 which might directly plug into the electrical positions of the console cables, or could include a series of probe connections retained against the appropriate circuit points on the cards under fixture 15 or both. The objective is to temporarily mount 15 so as to maintain appropriate electrical connections with the circuit points and/or connectors of the cards on board 14 sufficiently to permit the test sequence to be performed. Fixture 15 also could be arranged to provide appr...