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Split Tip Probe for Terminal Resistance Measurements

IP.com Disclosure Number: IPCOM000075003D
Original Publication Date: 1971-Jul-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 45K

Publishing Venue

IBM

Related People

Murcko, RM: AUTHOR

Abstract

This is a split tip probing device particularly adapted for making four-terminal resistance measurements. The probing device (Fig. 2) comprises a main body 1 surrounded with a phenolic sleeve 2, a nylon end cap 3, a stationary tip 4 of conductive material separated from a spring biased and slidable electrically conductive tip 5 by a TEFLON* tape 6. The stationary tip 4 is electrically connected with the current wire 7 and the slidable tip 5 is electrically connected with the voltage wire 8.

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Split Tip Probe for Terminal Resistance Measurements

This is a split tip probing device particularly adapted for making four-terminal resistance measurements. The probing device (Fig. 2) comprises a main body 1 surrounded with a phenolic sleeve 2, a nylon end cap 3, a stationary tip 4 of conductive material separated from a spring biased and slidable electrically conductive tip 5 by a TEFLON* tape 6. The stationary tip 4 is electrically connected with the current wire 7 and the slidable tip 5 is electrically connected with the voltage wire 8.

A pair of these specially constructed probing devices are electrically connected with a milliohmeter 9, as indicated in Fig. 1.

The device simplifies the process of making four-terminal resistance measurements and substantially reduces the time for the testing operation of high-density printed circuit cards and boards, or the like. * Trademark of E. I. du Pont de Nemours & Company.

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