Browse Prior Art Database

AC Probe

IP.com Disclosure Number: IPCOM000075329D
Original Publication Date: 1971-Sep-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 25K

Publishing Venue

IBM

Related People

Perlmann, A: AUTHOR

Abstract

Electrical connection between a tester and product I/O pads is established with a round probe having AC characteristics. To achieve the AC transmission line characteristics between the proximately positioned contact points of a product under test, the round probe is imbedded in a dielectric material.

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AC Probe

Electrical connection between a tester and product I/O pads is established with a round probe having AC characteristics. To achieve the AC transmission line characteristics between the proximately positioned contact points of a product under test, the round probe is imbedded in a dielectric material.

Probe 1 having a diameter D is imbedded in dielectric material 2 at a specified height h above a ground plane 2. With a dielectric constant of epsilon, the matched impedance of the probe configuration is:

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