Browse Prior Art Database

High Temperature Chip Handler

IP.com Disclosure Number: IPCOM000075378D
Original Publication Date: 1971-Sep-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 37K

Publishing Venue

IBM

Related People

Mulligan, JM: AUTHOR

Abstract

Test equipment for monolithic chips can only evaluate chip performance at room temperature. Certain electrical test conditions are stressed to compensate for elevated temperatures. This procedure results in rejecting good chips as well as passing bad chips that will not be detected until implemented in a finished system operating at high temperature.

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High Temperature Chip Handler

Test equipment for monolithic chips can only evaluate chip performance at room temperature. Certain electrical test conditions are stressed to compensate for elevated temperatures. This procedure results in rejecting good chips as well as passing bad chips that will not be detected until implemented in a finished system operating at high temperature.

A modification is incorporated in the chip handlers to preheat the chips. This is accomplished by utilizing the vacuum pencils to also provide the heat, so that the chip temperature can be elevated while in contact to the vacuum pencil. The chip handlers use the vacuum pencils to relocate the chips from a vibrating bowl to the electrical probe test station.

The figure shows the conduction heated vacuum pencil. The power leads 10 are fed through the vacuum shaft 12 to a proportional temperature controller or heater 14. A thermistor 16 will monitor temperature. If tight temperature control is mandatory, each heater will need a separate sensor and control. The vacuum line 18 connects to the centrally located vacuum hole 20 in the alumina base 22.

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