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Tester for Electric Conductors

IP.com Disclosure Number: IPCOM000075653D
Original Publication Date: 1971-Oct-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 46K

Publishing Venue

IBM

Related People

Bohlen, H: AUTHOR [+3]

Abstract

This tester serves to measure the electrical continuity between the ends of conductors in miniaturized wiring elements. It is particularly suitable for testing interconnections in multilayer substrates on which great numbers of chips are to be arranged.

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Tester for Electric Conductors

This tester serves to measure the electrical continuity between the ends of conductors in miniaturized wiring elements. It is particularly suitable for testing interconnections in multilayer substrates on which great numbers of chips are to be arranged.

Testing is carried out by placing testing tool 1 on substrate 2 containing conductor 3. Testing tool 1 comprises test electrodes 4 disposed adjacent to the ands of conductor 3. These electrodes are displaced from the surface, so that a defined gap exists between the conductor ends and test electrodes 4. By applying a DC voltage V to the pair of test electrodes, gas discharges are initiated across the two gaps. Initiation of the gas discharges is indicative of the continuity of conductor 3.

By suitably selecting the width of the gap, the ambient gas pressure, voltage V and the value of resistor 5, normal glow discharges are produced, so that overheating of the electrodes 4 is avoided.

Test electrodes 4 are free from wear and tear. Substrate 2 and the ends of conductors 3 are not damaged during testing. The tester permits testing a plurality of interconnections with lands arranged closely adjacent to each other. By adjusting the testing tool, all test electrodes are simultaneously and accurately adjusted. The testing tool can be produced, using the same technique as for the substrate to be tested.

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