Browse Prior Art Database

Multiprobe Contactor Unit

IP.com Disclosure Number: IPCOM000076415D
Original Publication Date: 1972-Feb-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 26K

Publishing Venue

IBM

Related People

Anesi, PW: AUTHOR [+4]

Abstract

High-density packing of probes with close center to center distances is achieved in this contactor unit. The probes have uniform force/ deflection ratios.

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Multiprobe Contactor Unit

High-density packing of probes with close center to center distances is achieved in this contactor unit. The probes have uniform force/ deflection ratios.

Probes 1, 2, 3 are preformed with appropriate tips for contacting the pads of integrated circuits. A machined or molded plastic retaining unit 4 has the probes located in it. A potting compound 5 assures the lateral stability of the probes and the constant force/deflection ratio. By varying the thickness of this potting compound, this ratio can be varied.

Interfacing of probes of this construction with an appropriate space transformer, yields a contacting unit having dynamic characteristics that accommodate both AC and DC test requirements.

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