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Contact Probe for Printed Conductors

IP.com Disclosure Number: IPCOM000076672D
Original Publication Date: 1972-Apr-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 45K

Publishing Venue

IBM

Related People

Renz, U: AUTHOR [+2]

Abstract

For testing the printed conductors on circuit cards or boards, which are connected to each other by plated through-holes, resilient contact probes are used, the pointed end of which is applied to the rims of the through-holes. It is possible that in a tester in which these resilient probes are used in great number, to test circuit boards having different conductor patterns and the point to which the probes are applied may be a conductor rather than a through-hole. In order to prevent the conductor from being damaged and false measurements being taken in such a case, contact probe 1 is provided with an isolating central insert nipple 4, 5. The nipple is preferably made of glass and comprises the shaft portion 4 that is inserted into a central bore in the probe and resiliently held therein by an elastic adhesive.

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Contact Probe for Printed Conductors

For testing the printed conductors on circuit cards or boards, which are connected to each other by plated through-holes, resilient contact probes are used, the pointed end of which is applied to the rims of the through-holes. It is possible that in a tester in which these resilient probes are used in great number, to test circuit boards having different conductor patterns and the point to which the probes are applied may be a conductor rather than a through-hole. In order to prevent the conductor from being damaged and false measurements being taken in such a case, contact probe 1 is provided with an isolating central insert nipple 4, 5. The nipple is preferably made of glass and comprises the shaft portion 4 that is inserted into a central bore in the probe and resiliently held therein by an elastic adhesive. The free end 5 of the insert nipple is preferably spherically shaped, protruding from the conductive contact area 3 on the front end of the contact probe. This contact area 3, providing a contact connection to the conductive rim of a through-hole during testing, is conically shaped, and includes ribs or teeth on the contact point to ensure a more effective penetration of any foreign layers.

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