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Browse Prior Art Database

Chip Torque Test

IP.com Disclosure Number: IPCOM000076719D
Original Publication Date: 1972-Apr-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 36K

Publishing Venue

IBM

Related People

Schick, OP: AUTHOR

Abstract

The described torque tester provides a shear displacement on the chip pad proportional to the distance to its neutral axis. This is accomplished by twisting the substrate and measuring the torsional forces imposed upon the joint with a torque transducer.

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Chip Torque Test

The described torque tester provides a shear displacement on the chip pad proportional to the distance to its neutral axis. This is accomplished by twisting the substrate and measuring the torsional forces imposed upon the joint with a torque transducer.

To start the operation, a substrate must be positioned in a small vise on top of the x-y positioning assembly and then placed upon an electromagnetic clutch. The assembly and substrate are considered aligned when the chip is positioned within the two concentric reticles located within the monocular microscope. The minimum and maximum tolerances of the chip are etched in the reticle as two concentric rectangles. After the chip is aligned to the reticle, the transducer is pivoted into positioned. The torsional rotation is supplied to the electromagnetic clutch by a synchronous motor attached by a bellows coupling.

The torque transducer is connected to a TEKTRONIX "Q" unit, not shown, which has its output connected to a single-channel recorder. The cycle is started by activating the electromagnetic clutch and drive motor. The x axis is represented as the time which is proportional to the torsional displacement, while the y axis is the torsional force. Thus, an x-y plot yields a torque versus twist curve.

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