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Testing Schmidt Triggers in Integrated Circuits

IP.com Disclosure Number: IPCOM000076747D
Original Publication Date: 1972-Apr-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 30K

Publishing Venue

IBM

Related People

Wilson, WT: AUTHOR [+2]

Abstract

Schmidt triggers incorporated into large-scale integrated circuit devices can be readily tested without complex sequencing of input pins by varying drive conditions.

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Testing Schmidt Triggers in Integrated Circuits

Schmidt triggers incorporated into large-scale integrated circuit devices can be readily tested without complex sequencing of input pins by varying drive conditions.

A sine wave or square wave that is DC shifted relative to the transfer characteristics of a Schmidt trigger provides testing without the use of special test patterns. A low-input drive signal, with an excursion from Vmin to within delta V of Vup, will provide an output voltage at V00. A high-input drive signal with an excursion from Vmax to within delta Vin of Vdn provides an output at V01. When the input voltage is greater than Vdn, but less than Vup, the output will be at either V01 or V00, depending upon whether the last input was greater than Vup or less than Vdn.

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