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Automatic Printed Circuits and Plated Through Hole Tester

IP.com Disclosure Number: IPCOM000076887D
Original Publication Date: 1972-May-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 66K

Publishing Venue

IBM

Related People

Flynn, PT: AUTHOR [+2]

Abstract

This is an automated apparatus for obtaining resistance measurements of printed circuits and plated through-holes on printed-circuit boards or the like. A printed-circuit board 1 is held vertically by the support arms 2 attached to a movable table 3. The support arms 2 are adjustable in both the horizontal and vertical planes to accommodate various size printed-circuit boards. The table 3 moves from right to left in predetermined incremental steps according to the printed-circuit board pattern under test. Travel is accomplished by an air drive 8 through a dog and rack mechanism 4. At the end of travel, the dog is tripped and the table 3 returns to the right-hand end. The step-by-step operation can be repeated.

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Automatic Printed Circuits and Plated Through Hole Tester

This is an automated apparatus for obtaining resistance measurements of printed circuits and plated through-holes on printed-circuit boards or the like. A printed-circuit board 1 is held vertically by the support arms 2 attached to a movable table 3. The support arms 2 are adjustable in both the horizontal and vertical planes to accommodate various size printed-circuit boards. The table 3 moves from right to left in predetermined incremental steps according to the printed-circuit board pattern under test. Travel is accomplished by an air drive 8 through a dog and rack mechanism 4. At the end of travel, the dog is tripped and the table 3 returns to the right-hand end. The step-by-step operation can be repeated.

The automatic probing apparatus comprises two movable platforms 5, which are mounted one on each side of and parallel to the movable table 3. Each of the platforms 5 support two manipulators 6 which in turn hold the probes 7. The manipulators 6 incorporate micrometers and are capable of making vernier adjustments to facilitate the testing operations. The platforms 5 move simultaneously and perpendicular to the specimen printed-circuit board 1 under control of air driven motors. This movement permits the probes 7 to move into contact with predetermined circuits of the printed-circuit board under test. Following the test, the platforms 5 are withdrawn and the movable table 3 moves to a new position to...