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Function Oriented Test Generation Method

IP.com Disclosure Number: IPCOM000076975D
Original Publication Date: 1972-May-01
Included in the Prior Art Database: 2005-Feb-24
Document File: 2 page(s) / 34K

Publishing Venue

IBM

Related People

Holzer, TJ: AUTHOR [+2]

Abstract

Programmable test systems require an efficient, accurate method of programming. A programming method using function-oriented commands which are independent of a particular test system or device is described.

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Function Oriented Test Generation Method

Programmable test systems require an efficient, accurate method of programming. A programming method using function-oriented commands which are independent of a particular test system or device is described.

A test system control language is comprised of a group of commands, wherein each command has associated with it a processor subroutine capable of interpreting the command and parameters, and producing the required operations to effect the command request.

The diagram depicts the programming method for testing a bandpass filter
10.

A test specification 1 for a component or device such as bandpass filter 10 is used to prepare a list 2 of statements to describe the test to be performed. A library 3 of command subroutines and the list 2 of statements are then processed 4 to generate either a control tape 5, a test program printout and step description 6, or direct control of a test apparatus 7.

In the example, the input 11, supply voltages 13 and 14 are specified and output 12 is predicted and compared with the actual results.

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