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Fabrication Method for Electrical Test Contactor

IP.com Disclosure Number: IPCOM000077423D
Original Publication Date: 1972-Jul-01
Included in the Prior Art Database: 2005-Feb-25
Document File: 2 page(s) / 32K

Publishing Venue

IBM

Related People

Meeker, RG: AUTHOR [+3]

Abstract

This method provides for designing contactor lead frames for any product configuration. Utilizing a file on past and future designs for determining tip shape, lead frame materials and machine functions for probing various types of pads, and an advanced programming language (APL) file on beam geometry designer oriented language (DOL) and Gerber mask generation, an optimum design of a cantilever contactor beam is obtained.

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Fabrication Method for Electrical Test Contactor

This method provides for designing contactor lead frames for any product configuration. Utilizing a file on past and future designs for determining tip shape, lead frame materials and machine functions for probing various types of pads, and an advanced programming language (APL) file on beam geometry designer oriented language (DOL) and Gerber mask generation, an optimum design of a cantilever contactor beam is obtained.

The designer receives a chip drawing 1 as his input. From this drawing he constructs a layout 2 showing radial contactor beam center lines with angular constraints. From data files 3, 4 of the APL type and layout 2 as taken together at 5, the designer determines the beam geometry and mechanical and material characteristics. The combined layout is defined in terms of x, y coordinates 6 and then provided as an input to the DOL 7. The designer oriented language generates a card deck 8 of x, y coordinates for the beam lead frame 13, as well as a mechanical drawing. Using APL 9, the DOL card deck is transferred to tape for use in generating art work 11 on a Gerber x, y artwork table 10. From the lead frame drawing 13 and the artwork 11 taken together at 12, etched lead frames for a contactor are fabricated at 14.

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