Browse Prior Art Database

Plunger Type Wire Probe

IP.com Disclosure Number: IPCOM000077683D
Original Publication Date: 1972-Sep-01
Included in the Prior Art Database: 2005-Feb-25
Document File: 2 page(s) / 40K

Publishing Venue

IBM

Related People

Markewycz, Z: AUTHOR

Abstract

As hysteresis is present in plunger type wire probes, they are not suitable for lead-tin pad systems. The hysteresis brings about damage to the pad. In this arrangement, a striker plate is employed for preventing damage to the probe contacts when not in use and for controlling the movement of the probes when making contact with the pads.

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Plunger Type Wire Probe

As hysteresis is present in plunger type wire probes, they are not suitable for lead-tin pad systems. The hysteresis brings about damage to the pad. In this arrangement, a striker plate is employed for preventing damage to the probe contacts when not in use and for controlling the movement of the probes when making contact with the pads.

Spring loaded or other wire probes 1, 2 ride in curved channels 3, 4 in an epoxy compound 5. The probe wires have a diameter approximating five mils. At the end of probes 1, 2, smaller wires 7, 8 which are two mils in diameter are brazed. At this location, a movable striker plate 6 is positioned. A fixed guide 9 has the ends of wires 7, 8 contained within it when striker plate 6 is in the retracted position. To effect contact with the lead-tin pads, striker plate 6 is lowered. The entire probe arrangement 1, 2 moves within the channels located in epoxy 5, soft-landing the probe wires onto the lead-tin pads eliminating hysteresis.

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