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Browse Prior Art Database

Automatic Testing System

IP.com Disclosure Number: IPCOM000077851D
Original Publication Date: 1972-Oct-01
Included in the Prior Art Database: 2005-Feb-25
Document File: 2 page(s) / 70K

Publishing Venue

IBM

Related People

Gratkowski, F: AUTHOR [+4]

Abstract

This is a system to test circuits on a printed board containing one or more integrated circuit modules.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 60% of the total text.

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Automatic Testing System

This is a system to test circuits on a printed board containing one or more integrated circuit modules.

A plurality of printed-circuit cards 1 to be tested are inserted in vertical side- by-side spaced relation in cartridge 2 (see Fig. 1). After the cards are preheated to a preselected temperature in a preheat area, not shown, the cartridge is moved in a direction parallel to the planes of the cards by pusher 3. During this movement, a member 4 projecting from the inner end of cartridge 2 has a tapered portion that spreads two spring-biased latches 5; then, as a half-nut formed in the end of member 4 moves into mesh with now stationary lead screw 6, the latches will snap into latching position (see Fig. 3) behind the tapered portion. Latches 5 are set in openings in continuous guide rails 7 that retain the half-nut in mesh with the lead screw and retain the cartridge accurately positioned relative to the lead screw axis.

As soon as the half-nut meshes with screw 6, motor 8 is energized to operatively, through belt 9, rotate screw 6 to move the cartridge parallel to the screw axis. When the leading card 1 contacts retractable able pin 10 of stop switch 11, the pin will yield slightly as a circuit is energized to disengage clutch 12 and engage brake 13 to stop screw 6 with the leading card aligned under grooves in side guides 14. Lifter 15 now lifts the card up into guides 14, as pin 10 returns to its normal position and while test head uni...