Dismiss
InnovationQ will be updated on Sunday, Oct. 22, from 10am ET - noon. You may experience brief service interruptions during that time.
Browse Prior Art Database

On Site Card Tester

IP.com Disclosure Number: IPCOM000077865D
Original Publication Date: 1972-Oct-01
Included in the Prior Art Database: 2005-Feb-25
Document File: 2 page(s) / 36K

Publishing Venue

IBM

Related People

Ippolito, SJ: AUTHOR [+2]

Abstract

The drawing shows an improved apparatus for testing a circuit card in the device using the card. During the test, a magnetic disk or other suitable device provides a conventional pattern of test signals on representative lines 2 and 3 that define signals that are to be applied to a particular terminal of the card to be tested, and the signals that should be produced at other terminals of the card if the card is faultless. An unused card socket 4 in the device is connected for each of its terminals to carry selectively, either input signals or output signals for the card to be tested.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 66% of the total text.

Page 1 of 2

On Site Card Tester

The drawing shows an improved apparatus for testing a circuit card in the device using the card. During the test, a magnetic disk or other suitable device provides a conventional pattern of test signals on representative lines 2 and 3 that define signals that are to be applied to a particular terminal of the card to be tested, and the signals that should be produced at other terminals of the card if the card is faultless. An unused card socket 4 in the device is connected for each of its terminals to carry selectively, either input signals or output signals for the card to be tested.

The drawing shows two representative terminals 5 and 6. For the example, terminal 5 carries an input signal defined by line 3 and terminal 6 carries an output signal that is to be compared with the test signal on line 2. A tester card 7 includes, for each terminal of the card to be tested, a circuit for either applying a test voltage in response to a test signal or comparing the output signal at a card terminal with the appropriate signal that is defined by the test pattern. Transistors 9, 10 and 11, 12 represent two such circuits in a simplified form. Transistor 11 is connected to transmit a signal applied to its base terminal from test signal line 3 to the associated terminal 5 of the card to be tested, where an illustrative transistor 14 has its base terminal connected. Transistor 10 has its base terminal connected to terminal 6 of the card to be tested where t...