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Optical X Ray Focusing and Alignment

IP.com Disclosure Number: IPCOM000078847D
Original Publication Date: 1973-Mar-01
Included in the Prior Art Database: 2005-Feb-26
Document File: 2 page(s) / 45K

Publishing Venue

IBM

Related People

Hayes, GF: AUTHOR [+2]

Abstract

A diffractometer used to analyze a contour surface is safely aligned with a predetermined spot on the surface, with a modified lathe tailstock centering microscope.

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Optical X Ray Focusing and Alignment

A diffractometer used to analyze a contour surface is safely aligned with a predetermined spot on the surface, with a modified lathe tailstock centering microscope.

A workpiece surface may be analyzed, for example. by a Norelco Model 12010200 diffractometer which analyzes interference patterns from an X-ray source, beamed at a fixed spot on the workpiece surface. If the predetermined spot is marked with a phosphor, the X-ray beam will indicate by fluorescence of the spot its correct position. However, the operator aligning the X-ray beam could be exposed to undesirable X-ray radiation.

In Fig. 1, the lathe tailstock centering microscope is mounted on a rail by means of an adapter. The workpiece to be measured is also mounted on the rail by a rotating X-Y stage. Using Incident light or additional light if necessary, the operator fixes the workpiece surface through the microscope eyepiece until the relative positions of the workpiece and the microscope are aligned, to bring the predetermined spot into the microscope crosshairs. Thereafter, the microscope may be removed and the X-ray beam applied along Its normal path for diffractometer (not shown) measurements. as shown in Fig. 2.

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