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Infrared Microscopy for the Determination of the Initial State of an Integrated Circuit

IP.com Disclosure Number: IPCOM000078936D
Original Publication Date: 1973-Apr-01
Included in the Prior Art Database: 2005-Feb-26
Document File: 2 page(s) / 28K

Publishing Venue

IBM

Related People

Feuer, M: AUTHOR [+2]

Abstract

One difficulty in testing integrated logic circuits is that the states of many internal logic blocks are not known at the outset. Much effort is spent setting these blocks to a known state by signals on the primary inputs of the integrated circuit.

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Infrared Microscopy for the Determination of the Initial State of an Integrated Circuit

One difficulty in testing integrated logic circuits is that the states of many internal logic blocks are not known at the outset. Much effort is spent setting these blocks to a known state by signals on the primary inputs of the integrated circuit.

The following arrangement of equipment is proposed to test integrated logic circuits:
1) An infrared scanner 1 can determine the initial state of all

the logic blocks of the integrated logic circuit 2 under test,

by detecting their radiation.
2) A hardware logic circuit simulator 3 is set up to duplicate

the desired behavior of the circuit under test.
3) The internal states of simulator 3 are made to match those

of the circuit 2 under test.
4) A series of input patterns is now applied by a pattern

generator 4 to both simulator 3 and the circuit 2 under test.
5) A comparator 5 compares the outputs of simulator 3 and

circuit

2 under test. Any mismatch in the output is now attributable

to a difference in the operation of the two circuits 2,3 and

not to differences in initial states.

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