Browse Prior Art Database

Creep Tester

IP.com Disclosure Number: IPCOM000079727D
Original Publication Date: 1973-Aug-01
Included in the Prior Art Database: 2005-Feb-26
Document File: 2 page(s) / 45K

Publishing Venue

IBM

Related People

Chen, YT: AUTHOR [+3]

Abstract

This creep tester is sufficiently sensitive to measure polymer film creep rates on the order of 10/-11//sec. The system is temperature stabilized by the heated fluid bath to +/- 0.01 degree C. However, thermal expansion or contraction of a sample over even that limited temperature range can mask extension due to creep.

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Creep Tester

This creep tester is sufficiently sensitive to measure polymer film creep rates on the order of 10/-11//sec. The system is temperature stabilized by the heated fluid bath to +/- 0.01 degree C.

However, thermal expansion or contraction of a sample over even that limited temperature range can mask extension due to creep.

This creep tester measures the differential displacement between two samples in the same temperature environment, in order to compensate for changes in length due only to thermal expansion. Each sample is initially the same length. Sample 1 is under tension, but is essentially load and stress free. Sample 2 is loaded to the required level of stress for testing. Each sample is then measured for change of length by a linear variable differential displacement transformer (LVDT), such as those available from Shaevitz Engineering. In view of the isolated and insulated nature of the sample chamber, both samples undergo identical linear changes due to temperature fluctuations. The differential displacement measurement between the two samples, as a function of time, is thus indicative of the creep of the stressed sample, independent of changes in both samples due to temperature fluctuations.

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