Browse Prior Art Database

Nonconductive Probe

IP.com Disclosure Number: IPCOM000079918D
Original Publication Date: 1973-Sep-01
Included in the Prior Art Database: 2005-Feb-26
Document File: 2 page(s) / 23K

Publishing Venue

IBM

Related People

Anderson, BR: AUTHOR [+4]

Abstract

Shown is a probe assembly of high sensitivity for use in nonelectrical conductive probing. Typically, probes of high sensitivity rely upon electrical continuity between probe and test part to indicate contact between the probe and the part. For nonconductive test parts, the above probe maintains high sensitivity and does not rely upon electrical conductivity.

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Nonconductive Probe

Shown is a probe assembly of high sensitivity for use in nonelectrical conductive probing. Typically, probes of high sensitivity rely upon electrical continuity between probe and test part to indicate contact between the probe and the part. For nonconductive test parts, the above probe maintains high sensitivity and does not rely upon electrical conductivity.

A probe 10 has mounted to its tip a small ball 12. Ball 12 is used to touch the test part. Probe 10 is mounted to the probe spindle 14 with mounting screws 16. A reduction in the probe 10 at area 18 acts as a pivot point for probe deflections. Deflection of the probe 10 is picked up by a radio-frequency sensing coil 22 epoxied to a plastic rod 20 at the bottom of the spindle 14. When the probe 10 contacts a test part, the probe deflects and the sensing coil 22 detects the deflection to indicate contact has been made.

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