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Buckling Beam Probe

IP.com Disclosure Number: IPCOM000079940D
Original Publication Date: 1973-Oct-01
Included in the Prior Art Database: 2005-Feb-26
Document File: 2 page(s) / 73K

Publishing Venue

IBM

Related People

Bruder, SI: AUTHOR [+3]

Abstract

Shown is a probe for probing closely spaced electrical contacts on surface of irregular height. Contact is made at the ends of conductors 2, 3 that are mounted on a frame 5. Frame 5 has a lower guide member 6 with holes through which the conductors extend, and it has an upper member 7 that holds the conductors in place. Conductors 2, 3 are rectangular in section and they buckle as their lower ends engage the contacts that are to be probed. The buckling action maintains equal force on each contact in spite of variations in contact height.

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Buckling Beam Probe

Shown is a probe for probing closely spaced electrical contacts on surface of irregular height. Contact is made at the ends of conductors 2, 3 that are mounted on a frame 5. Frame 5 has a lower guide member 6 with holes through which the conductors extend, and it has an upper member 7 that holds the conductors in place. Conductors 2, 3 are rectangular in section and they buckle as their lower ends engage the contacts that are to be probed. The buckling action maintains equal force on each contact in spite of variations in contact height.

Conductors 2 are formed on a board 8 by printed-circuit techniques and the board is etched away from the conductors in the region between member 7 and the contact making ends of the conductors. Several boards 8, 9 are arranged to form an array of probes. Conductors 3 are similarly formed on a flexible insulating support 10, and several supports 10, 11 are arranged to form the contact array. The probe may be made only of boards 8, 9 or only of flexible supports 10, 11 or of a suitable combination.

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