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Punch Overtravel Diagnostics

IP.com Disclosure Number: IPCOM000080049D
Original Publication Date: 1973-Oct-01
Included in the Prior Art Database: 2005-Feb-26
Document File: 2 page(s) / 52K

Publishing Venue

IBM

Related People

Kobliska, DC: AUTHOR [+3]

Abstract

A parallel punch having 80 positions, as shown in Fig. 1, has the overtravel adjustment X checked by a diagnostic device shown in Fig. 2. The check is implemented using a special punch sequence, wherein columns 1 thru 4 and 41 thru 44 are, respectively, punched in row 0 in a series of eight cards, columns 5 thru 8 and 45 thru 48 are, respectively, punched in row 1 of each of the same series of eight cards, etc., such that each column punch assembly punches a card of the series in one row position.

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Punch Overtravel Diagnostics

A parallel punch having 80 positions, as shown in Fig. 1, has the overtravel adjustment X checked by a diagnostic device shown in Fig. 2. The check is implemented using a special punch sequence, wherein columns 1 thru 4 and 41 thru 44 are, respectively, punched in row 0 in a series of eight cards, columns 5 thru 8 and 45 thru 48 are, respectively, punched in row 1 of each of the same series of eight cards, etc., such that each column punch assembly punches a card of the series in one row position.

When overtravel adjustment X is on the high side, the armature seals earlier and for a low setting, the seal time is later. Knowing the relationship of the magnet current actuating event, commonly an emitter, to the cam which controls latch motion, the time from current start to armature seal is a valid indicator of overtravel adjustment.

Current is measured across eight measuring resistors, A thru H, each common to ten punch positions. Using the special punching sequence, only one punch position of any ten common to a given row is activated at a time. In the switch position shown in Fig. 2, only the column 1 punch position will be measured using resistor A when row 0 is punched and only column 5 when the card is indexed to row 1, until in row 9 the column 37 punch position is measured. After one card is punched, the switch increments to the position whereat resistor B is connected causing punch positions 2, 6, 10, 14, 18, 22, 26, 30, 34, an...