Browse Prior Art Database

Circuit Test Point Switch

IP.com Disclosure Number: IPCOM000080711D
Original Publication Date: 1974-Feb-01
Included in the Prior Art Database: 2005-Feb-27
Document File: 2 page(s) / 48K

Publishing Venue

IBM

Related People

Stokan, MJ: AUTHOR

Abstract

Test points on a circuit board are connected to a cathode-ray oscilloscope (CRO) probe one-by-one by turning a switch.

This text was extracted from a PDF file.
At least one non-text object (such as an image or picture) has been suppressed.
This is the abbreviated version, containing approximately 100% of the total text.

Page 1 of 2

Circuit Test Point Switch

Test points on a circuit board are connected to a cathode-ray oscilloscope (CRO) probe one-by-one by turning a switch.

The usual method of testing a circuit board for correct operation is to connect a CRO's probe to each test point, view the CRO display and then move the probe to another point. Here, instead, the test points are plugged into the socket of a tester module. The CRO probe is attached to a single tester pin while a switch connects each test point in turn to the pin.

The same tester module may be used with different circuit boards or test point configurations, by providing additional switches between the module socket and additional test pins.

1

Page 2 of 2

2

[This page contains 3 pictures or other non-text objects]